Information for "ICTD 2008"
Basic information
| Display title | ICTD 2008 |
| Default sort key | ICTD 2008 |
| Page length (in bytes) | 591 |
| Page ID | 5557 |
| Page content language | en - English |
| Page content model | wikitext |
| Indexing by robots | Allowed |
| Number of redirects to this page | 0 |
| Counted as a content page | Yes |
Page protection
| Edit | Allow all users (infinite) |
| Move | Allow all users (infinite) |
Edit history
| Page creator | 127.0.0.1 (talk) |
| Date of page creation | 22:24, 14 October 2008 |
| Latest editor | 127.0.0.1 (talk) |
| Date of latest edit | 22:24, 14 October 2008 |
| Total number of edits | 1 |
| Total number of distinct authors | 1 |
| Recent number of edits (within past 90 days) | 0 |
| Recent number of distinct authors | 0 |
Page properties
| Transcluded templates (4) | Templates used on this page: |
Facts about "ICTD 2008"
| Acronym | ICTD 2008 + |
| End date | October 26, 2008 + |
| Event type | Conference + |
| Has coordinates | 30° 39' 36", 104° 3' 48"Latitude: 30.659863888889 Longitude: 104.06337222222 + |
| Has location city | Chengdu + |
| Has location country | Category:China + |
| Has location state | Sichuan + |
| Homepage | http://ictd08.uestc.edu.cn/index.php?show=call4paper + |
| IsA | Event + |
| Start date | October 25, 2008 + |
| Submission deadline | June 15, 2008 + |
| Title | IEEE Circuits and Systems International Conference on Testing and Diagnosis + |
