Information for "NEC 2008"
Basic information
| Display title | NEC 2008 |
| Default sort key | NEC 2008 |
| Page length (in bytes) | 2,078 |
| Page ID | 5443 |
| Page content language | en - English |
| Page content model | wikitext |
| Indexing by robots | Allowed |
| Number of redirects to this page | 0 |
| Counted as a content page | Yes |
Page protection
| Edit | Allow all users (infinite) |
| Move | Allow all users (infinite) |
Edit history
| Page creator | 127.0.0.1 (talk) |
| Date of page creation | 22:22, 14 October 2008 |
| Latest editor | 127.0.0.1 (talk) |
| Date of latest edit | 22:22, 14 October 2008 |
| Total number of edits | 1 |
| Total number of distinct authors | 1 |
| Recent number of edits (within past 90 days) | 0 |
| Recent number of distinct authors | 0 |
Page properties
| Transcluded templates (4) | Templates used on this page: |
Facts about "NEC 2008"
| Abstract deadline | October 31, 2007 + |
| Acronym | NEC 2008 + |
| End date | March 27, 2008 + |
| Event type | Conference + |
| Has coordinates | 31° 13' 56", 121° 28' 9"Latitude: 31.232275 Longitude: 121.46920833333 + |
| Has location city | Shanghai + |
| Has location country | Category:China + |
| Homepage | http://www.ieeenec.org + |
| IsA | Event + |
| Start date | March 24, 2008 + |
| Submission deadline | December 17, 2007 + |
| Title | 2nd IEEE International Nanoelectronics Conference + |
