IRPS 2020

IRPS 2020
2020 IEEE International Reliability Physics Symposium
Event in series	IRPS
Dates	2020/04/28 (iCal) - 2020/05/30
Homepage:	https://irps.org/
Location
Location:	Dallas, Texas, Online
Loading map... {"minzoom":false,"maxzoom":false,"mappingservice":"leaflet","width":"280px","height":"280px","centre":false,"title":"","label":"","icon":"","visitedicon":"","lines":[],"polygons":[],"circles":[],"rectangles":[],"wmsoverlay":false,"copycoords":false,"static":false,"zoom":false,"defzoom":14,"layers":["OpenStreetMap"],"overlaylayers":[],"resizable":false,"enablefullscreen":false,"scrollwheelzoom":true,"markercluster":false,"clustermaxzoom":20,"clusterzoomonclick":true,"clustermaxradius":80,"clusterspiderfy":true,"geojson":"","locations":[{"text":"\u003Cb\u003E\u003Cdiv class=\"mw-parser-output\"\u003E\u003C/div\u003E\u003C/b\u003E\u003Chr /\u003E\u003Cdiv class=\"mw-parser-output\"\u003E\u003C/div\u003E","title":"","link":"","lat":32.7762719,"lon":-96.7968559,"icon":""}],"imageoverlays":null}
Committees
General chairs:	Gaudenzio Meneghesso
Table of Contents

Sollte eigentlich vom 29.03.2020-02.04.2020 in Dallas, Texas, USA stattfinden, wurde aufgrund der COVID-19 Pandemie aber zeitlich verschoben und als Online-Konferenz abgehalten.

Topics of Interest

IRPS 2021 is soliciting increased participation in the following special focus topic areas.

• Circuit Reliability and Aging – RAS, self-healing, aging aware designs, design tools
• Emerging memory / Neuromorphic Computing– Reliability for PCM, MRAM, RRAM, ferroelectrics
• Reliability of RF/mmW/5G Devices – CMOS, SiGe BiCMOS, SOI, GaAs, GaN

Papers in the following areas are requested.

Circuits, Products, and Systems

• Circuit Reliability and Aging
• IC Product Reliability
• System Electronics Reliability
• Soft Errors
• ESD and Latchup
• Packaging and 2.5D/3D Assembly
• Reliability Testing
• Silicon Photonics
• RF/mmW/5G

Materials, Processing, and Devices

• Transistors
• Gate/MOL Dielectrics
• Beyond CMOS Devices
• Neuromorphic Computing Reliability
• Wide-Bandgap Semiconductors
• Compound and Optoelectronic Devices
• Metallization/BEOL Reliability
• Process Integration
• Failure Analysis
• Memory Reliability
• Photovoltaics
• MEMS