Difference between revisions of "CVPR 2022"

Latest revision as of 12:22, 22 August 2023

CVPR 2022
IEEE/CVF Conference on Computer Vision and Pattern
Event in series	CVPR
Dates	2022/06/18 (iCal) - 2022/06/24
Location
Location:	New Orleans, LA, USA
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Papers:	Submitted 8161 / Accepted 2063 (25.3 %)
Table of Contents

@@ Line 1: / Line 1: @@
 {{Event
 |Acronym=CVPR 2022
+|Title=IEEE/CVF Conference on Computer Vision and Pattern
+|Series=CVPR
 |Type=Conference
+|Field=computer vision, pattern recognition
+|Start date=2022/06/18
+|End date=2022/06/24
+|City=New Orleans
+|State=LA
+|Country=USA
+|Submitted papers=8161
+|Accepted papers=2063
 }}
-<!-- PLEASE ADAPT OR DELETE THIS PART COMPLETELY - You can just paste in the call for papers and remove this and the last line
-==Topics==
-==Submissions==
-==Important Dates==
-==Committees==
-* Co-Organizers
-* General Co-Chairs
-** [[has general chair::some person]], some affiliation, country
-* PC Co-Chairs
-** [[has program chair::some person]], some affiliation, country
-* Workshop Chair
-** [[has workshop chair::some person]], some affiliation, country
-* Panel Chair
-** [[has OC member::some person]], some affiliation, country
-* Seminars Chair
-** [[has tutorial chair::some person]], some affiliation, country
-* Demonstration Co-Chairs
-** [[has demo chair::some person]], some affiliation, country
-** [[has demo chair::some person]], some affiliation, country
-* Local Organizing Co-Chairs
-** [[has local chair::some person]], some affiliation, country
-* Program Committee Members
-** [[has PC member::some person]], some affiliation, country
--->

Acceptance rate	25.3 +
Accepted papers	2,063 +
Acronym	CVPR 2022 +
End date	June 24, 2022 +
Event in series	CVPR +
Event type	Conference +
Has coordinates	29° 58' 34", -90° 4' 42"Latitude: 29.975997222222 Longitude: -90.078213888889 +
Has location city	New Orleans +
Has location country	Category:USA +
Has location state	LA +
IsA	Event +
Start date	June 18, 2022 +
Submitted papers	8,161 +
Title	IEEE/CVF Conference on Computer Vision and Pattern +