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| + | HOW TO FIGHT LONELINESS 说：How to fight lonelinessSmile all the timeShine your teeth to meslengniasAnd sharpen them with liesAnd whatever is going downWill you follow aroundThat's how you fight lonelinessYou laugh at every jokeDrag your blanket blindlyFill your heart with smokeAnd the first thing that you wantWill be the last thing you'll ever needThat's how you fight itJust smile all the timeJust smile all the timeJust smile all the timeJust smile all the time |
| − | | Acronym = DATE 2010
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| − | | Title = Design, Automation & Test in Europe
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| − | | Type = Conference
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| − | | Series =
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| − | | Field = Uncategorized
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| − | | Homepage = www.date-conference.com
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| − | | Start date = Mar 8, 2010
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| − | | End date = Mar 12, 2010
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| − | | City= Dresden
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| − | | State =
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| − | | Country = Germany
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| − | | Abstract deadline =
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| − | | Submission deadline = Sep 6, 2009
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| − | | Notification =
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| − | | Camera ready =
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| − | <pre>
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| − | http://www.date-conference.com/files/file/10-cfp/DATE10-preliminaryCFP.pdf
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| − | Conference and Exhibition: March 8-12, 2010
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| − | Dresden, Germany
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| − | Call for Papers
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| − | Scope of the Event
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| − | The 13th DATE conference and exhibition is the main European event bringing together designers and design automation users, researchers and vendors, as well as specialists in the hardware and software design, test and manufacturing of electronic circuits and systems. It puts strong emphasis on both ICs/SoCs, reconfigurable hardware and embedded systems, including embedded software.
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| − | Structure of the Event
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| − | The five-day event consists of a conference with plenary invited papers, regular papers, panels, hot-topic sessions, tutorials, workshops, two special focus days and a track for executives. The scientific conference is complemented by a commercial exhibition showing the state-of-the-art in design and test tools, methodologies, IP and design services, reconfigurable and other hardware platforms, embedded software, and (industrial) design experiences from different application domains, such as automotive, wireless, telecom and multimedia applications. The organisation of user group meetings, fringe meetings, a university booth, a PhD forum, vendor presentations and social events offers a wide variety of extra opportunities to meet and exchange information on relevant issues for the design and test community. Special space will also be allocated for EU-funded projects to show their results. More details are given on the DATE website (www.date-conference.com).
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| − | Areas of Interest
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| − | Within the scope of the conference, the main areas of interest are: embedded systems, design methodologies, CAD languages, algorithms and tools, testing of electronic circuits and systems, embedded software, applications design and industrial design experiences. Topics of interest include, but are not restricted to:
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| − | • System Design Methods, Algorithm and Tools
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| − | • System Level Specification and Modeling
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| − | • System Synthesis and Optimization
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| − | • Model-based Design and Test
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| − | • Multi-Processor and Multi-Core Systems
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| − | • Network on Chip
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| − | • Reconfigurable and Adaptive Systems and Computing
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| − | • Real-time, Networked and Dependable Embedded Systems
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| − | • Simulation and Validation
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| − | • Assertion-based and Coverage-driven Verification
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| − | • Formal Methods and Formal Verification
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| − | • Design of Low Power Systems
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| − | • Power Estimation, Verification and Optimization
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| − | • Architectural and Microarchitectural Design
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| − | • Architectural Synthesis
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| − | • Logic and Technology Dependent Synthesis for
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| − | Deep-Submicron Circuits
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| − | • Physical Design and Verification
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| − | • Analogue and Mixed Signal Systems and Design
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| − | • Interconnect, EMC and Packaging
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| − | • MEMS and Nanotechnology
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| − | • Sensor Networks and Technologies • Compilers and Code Generation for Embedded Systems
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| − | • Software for MPSoC and Multi-Core Systems
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| − | • Hardware-Dependent Software
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| − | • System and Industrial Test
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| − | • Test and Design for Manufacturability
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| − | • Design for Test
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| − | • BIST and Embedded Test
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| − | • Test Generation, Simulation and Diagnosis
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| − | • On-line Testing and Fault Tolerance
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| − | • High-Speed Test
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| − | • Test for Variability, Reliability and Defects
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| − | • Analogue/Mixed-Signal,/MEMS/RF Testing
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| − | • Industrial Design Methods
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| − | • Media and Signal Processing
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| − | • Automotive Electronics and Software
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| − | • Wireless Communication and Networking
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| − | • Secure and Safety-Critical Implementations
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| − | • Military, Space and Avionics
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| − | • Technologies and Applications for Healthcare
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| − | • Emerging Technologies, Systems, Standards and Applications
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| − | • Design and Application Case Studies
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| − | Submission of Papers
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| − | All papers have to be submitted electronically by September 6th, 2009 via:
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| − | http://www.date-conference.com/submit.html
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| − | Papers can be submitted either for standard oral presentation or for interactive presentation.
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| − | Conference and Exhibition Secretariat
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| − | European Conferences
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| − | 3 Coates Place, Edinburgh, EH3 7AA, UK
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| − | Tel: +44-131-225-2892 Fax: +44-131-225-2925
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| − | Email: sue.menzies@ec.u-net.com
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| − | | |
| − | Chairs
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| − | General Chair: Giovanni De Micheli, EPFL, Lausanne, Switzerland, giovanni.demicheli@epfl.ch
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| − | Program Chair: Wolfgang Mueller, University of Paderborn, Germany, wolfgang@acm.org
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| − | Click here for the PDF version of the call for papers.
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| − | </pre>This CfP was obtained from [http://www.wikicfp.com/cfp/servlet/event.showcfp?eventid=6088&copyownerid=5474 WikiCFP]
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