DBTest 2009
DBTest 2009 | |
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Second ACM International Workshop on Testing Database Systems
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Dates | Jun 29, 2009 (iCal) - Jun 29, 2009 |
Homepage: | dbtest2009.ethz.ch |
Location | |
Location: | Providence, USA |
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Important dates | |
Submissions: | Apr 3, 2009 |
Camera ready due: | May 22, 2009 |
Table of Contents | |
C A L L F O R P A P E R S Second ACM International Workshop on Testing Database Systems (DBTest 2009) Jun 29th, 2009 Providence, Rhode Island USA (collocated with ACM SIGMOD/PODS 2009) http://dbtest2009.ethz.ch/ Motivation and Scope The functionality provided by modern database management systems (DBMS), data storage services, and database applications is continuously expanding. New trends in hardware architectures, new data storage requirements, and new usage patterns drive the need for continuous innovation and expansion. As a result, these system/ applications are becoming increasingly complex and difficult to validate. As a consequence, testing and tuning these system/applications is becoming increasingly expensive and are often dominating the release cycle. It is not unusual that fifty percent of the development cost is spent on testing and tuning and that several months are reserved for testing before a new release can be shipped. Without revolutionary new ideas, the situation is getting even worse in the future. The first workshop on testing database systems (collocated with SIGMOD 2008) has shown that there is a huge interest of the industry to discuss problems in the area of testing database systems together with the academic community. Moreover, testing has recently gained more attention in the database community with an increasing number of conference submissions as well as a special issue of the IEEE Data Engineering Bulletin in this area. The main purpose of this workshop is to continue the discussion between industry and academia in order to come up with a research agenda that describes important open problems in the area of testing database systems/applications. The long term goal is to devise new techniques which solve these problems in order to reduce the cost and time to test and tune database products so that users and vendors can spend more time and energy on actual innovations. Obviously, the software engineering community has already worked intensively on testing related problems. However, testing DBMS/database applications imposes particular challenges and opportunities which have not been addressed in either the database or software engineering community. The participants of this workshop will be from both industry and academia. All papers will be selected from submissions by the program committee after peer reviewing. In addition to novel techniques, the workshop will present war stories as well as vision papers in order to define and better understand the problem space. Topics of Interest * Testing techniques for DBMS, data storage services, database applications * Generation of synthetic data for test databases * Generation of stochastic test models for large test matrices * Techniques and algorithms for automatic program verification * Maximizing code coverage of database systems/applications * Testing correctness of database systems/applications * Test-modelling of database systems/applications * Testing and designing systems that are robust to estimation inaccuracies * Testing the efficiency of adaptive policies and components * Minimizing, automating and ranking of engine tuning parameters * Identifying performance bottlenecks * Workload characterization with respect to performance metrics * Workload characterization with respect to engine components * Metrics for predictability of query and workload performance * Metrics for query plan robustness * Security and vulnerability testing * War Stories and vision papers Paper Submission DBTest 2009 invites the submission of original contributions in the area of testing and tuning database management systems (DBMS), data storage services, and database applications. As mentioned above, DBTest is also interested in war stories, practitioner's reports, and vision papers on techniques and issues in testing and tuning those systems. Papers should be formatted according to the ACM guidelines and SIGMOD proceedings template available at: http://www.sigmod09.org/sigmod_formatting.shtml Papers should not be longer than six pages and should be submitted in PDF by E-Mail to: dbtest2009@inf.ethz.ch Important Dates Paper Submission: April 3, 2009 (Friday, 5PM PST) Notification of acceptance: May 8, 2009 (Friday) Camera-ready: May 22, 2009 (Friday) Workshop: June 29, 2009 (Monday) Workshop Chairs Carsten Binnig, ETH Zurich, Switzerland (carsten.binnig@inf.ethz.ch) Benoit Dageville, Oracle Corporation, USA (benoit.dageville@oracle.com) Steering Comittee Leo Giakoumakis, Microsoft Corporation, USA (leogia@microsoft.com) Donald Kossmann, ETH Zurich, Switzerland (kossmann@inf.ethz.ch) Program Committee Surajit Chaudhuri Microsoft Research, USA Mitch Cherniack Brandeis University, USA Enzo Cialini IBM DB2, Canada Leo Giakoumakis Microsoft SQL Server, USA Jayant Haritsa Indian Institute of Science, India Donald Kossmann ETH Zurich, Switzerland Eric Lo HK Polytec University, Hong Kong Andreas Leitner ETH Zurich, Switzerland Chaitanya Mishra University of Toronto, Canada Patrick O'Neil University of Massachusetts Boston, USA Glen Paulley Sybase iAnywhere, Canada Ravi Sahani Oracle, USA Eric Simon SAP BO, France Avik Sinha IBM Research, USA Ed Triou Microsoft SQL Server, USA Florian Waas Greenplum, USA Khaled Yagoub Oracle, USA
This CfP was obtained from WikiCFP
Facts about "DBTest 2009"
Acronym | DBTest 2009 + |
Camera ready due | May 22, 2009 + |
End date | June 29, 2009 + |
Event type | Workshop + |
Has coordinates | 41° 49' 26", -71° 24' 46"Latitude: 41.823988888889 Longitude: -71.412833333333 + |
Has location city | Providence + |
Has location country | Category:USA + |
Homepage | http://dbtest2009.ethz.ch + |
IsA | Event + |
Start date | June 29, 2009 + |
Submission deadline | April 3, 2009 + |
Title | Second ACM International Workshop on Testing Database Systems + |